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Home   •   Support  •  STN  •  e-Seminars and Training  •  Edison, New Jersey
STN Workshops and User Update in Edison, New Jersey

The following STN Workshops and User Update will be held May 13-15, 2008 at the Exceed Education Center in Edison, New Jersey.  STN Workshops and User Updates are free, but registration is required.


May 13 STN Workshop

9:00 am - 4:00 pm:  Structure Searching in CAS REGISTRY

Learn about:

  • Building chemical structures using STN Express
  • Using structures to locate matches in CAS REGISTRY
  • Techniques for conducting substructure searches
  • Locating associated literature references in CAplus
  • Setting up SMARTracker alerts of CAS databases

To register, complete the STN Workshop and User Meeting Registration Form.

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May 14 STN Workshop

9:00 am - 4:00 pm:  Markush Searching in the Patent Literature

Learn about:

  • Techniques for developing effective Markush structures for searching MARPAT
  • How and when to use the CASLINK command to conduct automatic, sequential searches of CAS REGISTRY and MARPAT

To register, complete the STN Workshop and User Meeting Registration Form.

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May 15 STN User Update

9:00 am - 4:00 pm

What's New on STN?

To improve your searching efficiency, get up-to-date on the latest from STN.  In this session, we will discuss:

  • Updates to the latest version of STN Express and other STN interfaces
  • Enhancements to CAS and STN databases
  • STN resources for new and experienced searchers
  • Tips to make STN searching more efficient 

Expanding Your Search with Controlled Terminology

The CA Lexicon, a powerful online thesaurus, provides insights into the indexing terminology used in CAplus. In this session, learn how to use the CA Lexicon to: 

  • Identify terminology that will increase recall for text-based searches 
  • Increase recall using CA Lexicon chemical substance entries 
  • Refine large answer sets occurring from chemical structure searches

Exploring STN AnaVist, Version 2.0

STN AnaVist, Version 2.0, offers a variety of exciting new features and functionality to enhance your analysis and visualization projects.  The addition of Derwent World Patents Index (DWPI) is one of the major enhancements available in Version 2.0.  In this session, we will demonstrate how to:

  • Customize visualizations with optional data fields for clustering, including Title/Abstract, Technology Indicators, Exemplary/First Claim, and All Claims, or International Patent Classification (IPC) Codes
  • Manage documents using custom labels
  • Use comparison highlighting in the Research Landscape

Designed for new and existing users, this session will demonstrate how new features and content in Version 2.0 make STN AnaVist an even more valuable resource for effective decision making.

Habits of Highly Effective Searchers 

Discover ways to improve your confidence in your search results and make searching easier:

  • Online thesauri to increase relevant retrieval
  • Multifile search techniques to expand search results
  • ANALYZE to understand answer sets and develop better search strategies

To register, complete the STN Workshop and User Meeting Registration Form.

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Updated 3/3/2008 9:26:10 AM
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