• CAS
  • |
  • C&EN
  • |
  • Journals
  • |
  • ACS

search site
Advanced Search »
  • Home
  • |
  • About CAS
    • 100th Anniversary Celebration
    • CAS Quotes
    • Colors of Chemistry
    • Careers at CAS
    • Contact Us
    • Directions to CAS
    • FAQs
  • |
  • Our Expertise
    • CAS Databases
    • Value Added Tools
    • Technical Service and Support
  • |
  • Solutions
    • Researchers
    • IP Professionals
    • Information Professionals
    • Academics
  • |
  • Products & Services
    • SciFinder
    • SciFinder Scholar
    • STN Family of Products
    • Science IP
    • CAS Client Services
    • CAS Document Detective Service
    • CD Products
    • Print Products
  • |
  • Support & Training
    • SciFinder
    • SciFinder Scholar
    • STN
    • STN Express
    • STN AnaVist
    • STN Viewer
    • STN on the Web
    • STN Easy
    • CAS Customer Care
  • |
  • News & Events
    • What's New
    • Press Room
    • News Releases
    • In the News
    • Trade Shows
  • STN Support Home
  • e-Seminars and Training
  • STNews
  • Database Summary Sheets
  • User Documentation
  • Technical Support

For STN product information and to download the latest software, visit Products & Services.

For additional information or assistance, contact CAS Customer Care. 

Home   •   Support  •  STN  •  e-Seminars and Training  •  Chicago, Illinois
STN Workshops and User Update in Chicago, Illinois

The following STN Workshops and User Update will be held May 14 & 15, 2008 at MicroTek in Chicago, Illinois.  STN Workshops and User Updates are free, but registration is required.


May 14 STN Workshop

9:00 am - 12:00 pm:  STN Basics

Learn about:

  • Identifying databases containing information of interest
  • Basic keyword searches
  • Techniques to enhance search results including relevance ranking and setting up current awareness alerts

To register, complete the STN Workshop and User Meeting Registration Form.

-BACK-


May 14 STN Workshop

1:00 pm - 4:00 pm:  Advanced Subject Search Techniques in CAplus

Learn about:

  • Using the CA Lexicon to enhance and extend the results of keyword searches
  • Techniques to use the CA Lexicon as a source of terminology
  • Methods for refining large answer sets 

To register, complete the STN Workshop and User Meeting Registration Form.

-BACK-


May 15 STN Workshop

9:00 am - 12:00 pm:  Exploring STN AnaVist, Version 2.0

STN AnaVist, Version 2.0, offers a variety of exciting new features and functionality to enhance your analysis and visualization projects.  The addition of Derwent World Patents Index (DWPI) is one of the major enhancements available in Version 2.0.  In this session, we will demonstrate how to:

  • Customize visualizations with optional data fields for clustering, including Title/Abstract, Technology Indicators, Exemplary/First Claim, and All Claims, or International Patent Classification (IPC) Codes
  • Manage documents using custom labels
  • Use comparison highlighting in the Research Landscape

Designed for new and existing users, this session will demonstrate how new features and content in Version 2.0 make STN AnaVist an even more valuable resource for effective decision making.

To register, complete the STN Workshop and User Meeting Registration Form.

-BACK-


May 15 STN User Update

1:00 pm - 4:00 pm

What's New on STN?

To improve your searching efficiency, get up-to-date on the latest from STN.  In this session, we will discuss:

  • Updates to the latest version of STN Express and other STN interfaces
  • Enhancements to CAS and STN databases
  • STN resources for new and experienced searchers
  • Tips to make STN searching more efficient 

Habits of Highly Effective Searchers 

Discover ways to improve your confidence in your search results and make searching easier:

  • Online thesauri to increase relevant retrieval
  • Multifile search techniques to expand search results
  • ANALYZE to understand answer sets and develop better search strategies

To register, complete the STN Workshop and User Meeting Registration Form.

-BACK-

Updated 3/3/2008 9:27:09 AM
Home  |  About CAS  |  Our Expertise  |  Solutions  |  Products & Services  |  Support  |  News & Events
Copyright © 2008 American Chemical Society