The following STN Patent Forum will be presented by CAS and FIZ Karlsruhe on September 18, 2008 at MicroTek in Washington, DC. STN Patent Forums are free, but registration is required.
Lunch will be provided.
11:30 am - 12:15 pm
Increasing Your Confidence in STN Patent Search Results
Improve confidence in your patent search results by reviewing STN commands and tools. Tips will include:
- Using appropriate truncation and proximity in bibliographic and full-text patent databases
- Utilizing online thesauri to increase relevant retrieval
- Extending searches effectively across other databases
- Identifying terminology changes across databases
- Extracting terms for duplicate identification and analysis
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12:15 pm - 1:00 pm
The Art of ECLA
Patent searchers need as many tools as possible to perform the most cost-effective, comprehensive, and relevant searches. Availability of the European Classification (ECLA) system in Derwent World Patents Index (DWPI), INPAFAMDB, CAplus, and RDISCLOSURE allows for more effective multi-file searching. With approximately twice as many classifications as the Advanced International Patent Classification (IPC) system, ECLA also enhances search specificity.
In this session, we will discuss tips and techniques for using ECLA with IPC and In Computer Only (ICO) classification. Whether you are searching for known compounds used with a new delivery method, engineering devices or equipment, oil reforming/refining processes, or semiconductors, this session will help you maximize the comprehensiveness of your retrieval.
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Updated 7/14/2008 3:16:25 PM
