The following STN Patent Forum will be presented by CAS and FIZ Karlsruhe on April 29, 2008 at the Embassy Suites San Francisco Airport in South San Francisco, California. STN Patent Forums are free, but registration is required.
9:00 am - 10:00 am
What's New on STN?
Get up-to-date on the latest from STN. Learn whats new, including:
- STN Express, Version 8.3
- Prophetic substances in CA/CAplus
- Enhanced timeliness in USGENE
- Custom International Patent Classification (IPC) display formats
- Enhancements for DGENE, INPADOCDB, and WPIX
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10:00 am - 11:15 am
Finding and Understanding Nanoscience and Nanotechnology Information
The interdisciplinary fields of nanoscience and nanotechnology involve manipulating materials on the molecular scale to produce substances that have unique properties and applications. These emerging fields have the potential to revolutionize products in many markets.
This session will focus on using STN to answer questions related to the discovery, development, patenting, and commercial applications of nanomaterials and nanodevices for biological, chemical, and engineering use.
Topics will include:
- STN resources for nanotechnology information
- Techniques for query development
- Analysis and visualization tools to provide insights into trends in nanoscience and nanotechnology
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11:00 am - 11:15 am
Break
11:15 am - 12:15 pm
The Art of ECLA
Patent searchers need as many tools as possible to perform the most cost-effective, comprehensive, and relevant searches. Addition of the European Classification (ECLA) system to INPADOCDB, CAplus, and RDISCLOSURE allows for more effective cross-file searching. With approximately twice as many classifications as the Advanced International Patent Classification (IPC) system, ECLA also enhances search specificity.
In this session, we will discuss tips and techniques for using ECLA with IPC and In Computer Only (ICO) classification. Whether you are searching for known compounds used with a new delivery method, engineering devices or equipment, oil reforming/refining processes, or semiconductors, this session will help you maximize the comprehensiveness of your retrieval.
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12:15 pm - 1:15 pm
Lunch (provided)
1:15 pm - 2:30 pm
Increasing Your Confidence in STN Patent Search Results
Improve confidence in your patent search results by reviewing STN commands and tools. Tips will include:
- Using appropriate truncation and proximity in bibliographic and full-text patent databases
- Utilizing online thesauri to increase relevant retrieval
- Extending searches effectively across other databases
- Identifying terminology changes across databases
- Extracting terms for duplicate identification and analysis
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2:30 pm - 2:45 pm
Break
2:45 pm - 4:00 pm
Exploring Derwent World Patents Index in STN AnaVist, Version 2.0
STN AnaVist provides you with insight into competitor strategies over time and allows you to scan the big picture view of current research areas. Use STN AnaVist to assimilate and present information more effectively and to assist in management decision making.
In this session, learn how to:
- Discover the latest developments in an area of technology
- Gain immediate insights into the patent activities of competitors and other key players
- Identify key researchers and experts in scientific areas
- Discover collaborative efforts between organizations
The addition of Derwent World Patents Index (DWPI) to STN AnaVist is one of the major enhancements available in Version 2.0. We will use a case-study approach to demonstrate how to:
- Create a DWPI analysis and visualization project
- Customize visualizations with optional data fields, including DWPI Title/Abstract and Exemplary Claim
- Manage documents using your own custom labels
- Use comparison highlighting in charts and the Research Landscape
- Create DWPI-specific charts for DWPI Classes and Manual Codes
This session is designed for both new and experienced users.
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Updated 4/2/2008 1:53:34 PM
