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Home   •   Support  •  STN  •  e-Seminars and Training  •  New York, New York
STN Patent Forum in New York, New York

The following STN Patent Forum will be presented by CAS and FIZ Karlsruhe on April 24, 2008 at the Residence Inn New York Manhattan/Times Square in New York City.  STN Patent Forums are free, but registration is required.

Lunch will be provided.


11:30 am - 12:15 pm

The Virtual Database Reloaded and Remixed

The single best patent database on STN is the one created virtually.  To meet your specific needs, use superior multifile capabilities on STN to search, extract, and display portions of records from multiple databases.  With several recently reloaded databases, many new opportunities are available to create even better virtual records. 

Topics in this session will include:

  • Enhanced patent database content, including patent family information, full-text patents, claims, and legal status
  • Techniques to easily merge content from several databases
  • Eliminating duplicate information across databases
  • Setting custom formats that display across multiple databases
  • Using STN Express to create custom final merged reports

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12:15 pm - 1:00 pm

The Art of ECLA

Patent searchers need as many tools as possible to perform the most cost-effective, comprehensive, and relevant searches.  Addition of the European Classification (ECLA) system to INPADOCDB, CAplus, and RDISCLOSURE allows for more effective cross-file searching.  With approximately twice as many classifications as the Advanced International Patent Classification (IPC) system, ECLA also enhances search specificity.

In this session, we will discuss tips and techniques for using ECLA with IPC and In Computer Only (ICO) classification.  Whether you are searching for known compounds used with a new delivery method, engineering devices or equipment, oil reforming/refining processes, or semiconductors, this session will help you maximize the comprehensiveness of your retrieval. 

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Updated 4/2/2008 1:19:56 PM
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