• CAS
  • |
  • C&EN
  • |
  • Journals
  • |
  • ACS

search site
Advanced Search »
  • Home
  • |
  • About CAS
    • CAS Media Library
    • CAS Quotes
    • Colors of Chemistry
    • 100th Anniversary Celebration
    • Careers at CAS
    • FAQs
    • Directions to CAS
    • Contact Us
  • |
  • Our Expertise
    • CAS Databases
    • Value Added Tools
    • Technical Service and Support
  • |
  • Solutions
    • Researchers
    • IP Professionals
    • Information Professionals
    • Academics
  • |
  • Products & Services
    • SciFinder
    • STN Family of Products
    • Science IP
    • CAS Client Services
    • CAS Document Detective Service
    • CD Products
    • Print Products
  • |
  • Support & Training
    • SciFinder
    • SciFinder Scholar
    • STN
    • STN Express
    • STN AnaVist
    • STN Viewer
    • STN on the Web
    • STN Easy
    • CAS Customer Care
  • |
  • News & Events
    • What's New
    • Press Room
    • News Releases
    • In the News
    • Trade Shows
  • STN Support Home
  • e-Seminars and Training
  • STNews
  • Database Summary Sheets
  • User Documentation
  • Technical Support

For STN product information and to download the latest software, visit Products & Services.

For additional information or assistance, contact CAS Customer Care. 

Home   •   Support  •  STN  •  e-Seminars and Training  •  New Brunswick, New Jersey
STN Patent Forum in New Brunswick, New Jersey

In conjunction with the PIUG 2008 Northeast Conference

The following STN Patent Forum will be presented by CAS and FIZ Karlsruhe on October 13, 2008 at the Hyatt Regency in New Brunswick, New Jersey.  STN Patent Forums are free, but registration is required.

FIZ Karlsruhe will also present two STN Workshops on October 15.  For details, visit FIZ Karlsruhe STN Workshops in the USA.


9:00 am - 10:00 am

What's New on STN?

Get up-to-date on the latest from STN.  Learn whats new, including:

  • STN Express, Version 8.3
  • Prophetic substances in CA/CAplus
  • Custom International Patent Classification (IPC) display formats
  • Enhancements for DGENE, USGENE, and PCTGEN
  • The International Patent Family Database (INPAFAMDB)
  • Enhancements to Derwent World Patents Index (DWPI)

-BACK-


10:00 am - 11:15 am

Understanding First-Level and Value-Added Patent Databases on STN

During the last decade, first-level full-text and bibliographic patent databases have become readily available for online searching.  Patent information professionals are often challenged to prove that first-level patent data are not sufficient for a thorough business-critical patent search.  In this session, we will:

  • Use a case study to explore first-level and value-added patent databases on STN, including Derwent World Patents Index (DWPI), CAplus, MARPAT, INPAFAMDB, USPATFULL, and others
  • Provide tips and advice on how to conduct all-inclusive searches using multiple databases on STN 

-BACK-


11:15 am - 12:15 pm

Current-Awareness Searches in Patent Databases on STN

A current-awareness alert (SDI) is a useful tool for the surveillance of specific research topics, competitors, inventors, patents, and legal status information.  In this session, we will review the searching skills needed to identify relevant information in a consistent and periodic manner and how to receive this information in the most efficient and useful format.

We will also discuss how certain SDI features and options available in CAplus, Derwent World Patents Index (DWPI), and DWPI First View can be used to retrieve comprehensive results, including:

  • Automatic and manual alerts
  • Multifile alerts and package alerts
  • Choosing the right update code
  • Multifile patent family and legal status alerts 

-BACK-


12:15 pm - 1:15 pm

Lunch (provided)


1:15 pm - 2:45 pm

Patent Citation Analysis on STN

Patent citation analysis is a valuable technique when extending prior art searches to include information on validity, competitive intelligence, and patent infringement.  However, citation searching may also lead to irrelevant materials.  In this session, we will discuss effective approaches to patent citation analysis in patent citation databases on STN, including the new INPAFAMDB and the recently reloaded Patents Citation Index (PCI). 

-BACK-


2:30 pm - 2:45 pm

Break 


2:45 pm - 4:00 pm

Increasing Your Confidence in STN Patent Search Results

Improve confidence in your patent search results by reviewing STN commands and tools.  Tips will include:

  • Using appropriate truncation and proximity in bibliographic and full-text patent databases
  • Utilizing online thesauri to increase relevant retrieval
  • Extending searches effectively across other databases
  • Identifying terminology changes across databases
  • Extracting terms for duplicate identification and analysis 

-BACK-

Updated 9/3/2008 10:10:46 AM
Home  |  About CAS  |  Our Expertise  |  Solutions  |  Products & Services  |  Support  |  News & Events
Copyright © 2008 American Chemical Society