STNews - April 2011


Expanded Swedish Patent Application Coverage in CA/CAplus Provides More Current and Complete Information

CAS has expanded its extensive patent coverage by including Swedish patent applications (kind code A1) from April 13, 2010 to present.

Swedish A1 patent applications can be accessed as basics or as equivalents to existing patent families. In addition, the following Swedish kind codes are now eligible to be added to patent families:

  • A0 (Patent application made available to the public)
  • A2 (Corrected patent application)
  • C3 (Corrected granted patent)
  • T3 (Translation of EP patent)

For additional information, visit Coverage of CA Basic Patents by Year

European Patent Classification Thesauri Added to DWPI

Thesauri for ECLA (European patent classifications) and ICO (In Computer Only) are now available in the Derwent World Patent Index (DWPISM) databases on STN (WPINDEX/WPIDS/WPIX).

Thesauri for ECLA (European patent classifications) and ICO (In Computer Only) are now available in the (DWPI) databases on STN (WPINDEX/WPIDS/WPIX).

The European Patent Classifications are indexed in the search fields /EPC (for ECLA codes) and /ICO (for in-computer-only codes). Both thesauri will be updated on a monthly basis subject to availability of the data.

Hierarchies of terms in the thesaurus can be displayed using the EXPAND command followed by a plus symbol (+), a Relationship Code and /EPC or /ICO, e.g., e A01B+all/epc.

To use the thesaurus to automatically include additional Narrower, Broader, Related, and other terms in a search, the SEARCH command should be entered with a term followed by a plus symbol (+), a Relationship Code, and /NCL, e.g., s K01B+nt/ico.

The thesauri can be used with the EXPAND and SEARCH command in the EPC and ICO fields. The following relationship codes are available:

Code           Description
----------     -----------
ALL            All usually required terms
AUTO           Automatic relationship
BT             Broader terms
CODE           Classification Code
DEF            Definition
HIE            Hierarchy terms (all broader and narrower terms)
KT             Keyword terms
MAX            All associated terms
NEXT           Next classification within the same class
NEXT(n)        Next n classifications within the same class
NT             Narrower terms
PREV           Previous Code within the same class
PREV(n)        Previous n classifications within the same class
TI             Complete title including broader terms

MEDLINE Improvements Provide Fast and Simple Access to DOI and Chemical Name Information

MEDLINE users can access full-text source material quicker, courtesy of Digital Object Identifier (DOI) information included, as available, in BIB and ALL displays. There is no additional charge for DOIs in these frequently used display formats.

Also, content of the Chemical Name (CN) field has been streamlined for easier review. The field now covers just chemical names (including the names of chemical classes) and, as available, Enzyme Commission Numbers.

Both enhancements are also included in the MEDLINE Learning (LMEDLINE) and TOXCENTERSM databases.

STN News - What's New on STN

   September, 2015 | PatentPak - A Time Saving
   Solution for IP Professionals - Is Coming to STN
   in Early 2016!
   July/August, 2015 | Latest New STN Release Features
   Eight New Databases Including MARPAT from CAS for
   Markush Structure Searching
   June, 2015 | CAS REGISTRY – 50 Years Strong, 100
   Million Substances Driving Your Research


View or sign-up for STN News e-Newsletter

STN Training

Training Events
     PatentPak(TM) - a Time-saving Solution Coming
     Soon to STN!
      November 4, 9am EST
      November 4, 1pm EST

     Searching DWPI Polymer Indexing on new STN
      November 19, 9am EST
      November 19, 2pm EST
Click here to Register

    STN Patent Forum
      October 12, 9:00am - 4:00pm EDT
      NE PIUG Meeting, New Brunswick NJ
Click here to Register for the STN Patent Forum

Contact Us

E-mail   Phone & Fax   800-753-4227 (North America)
    614-447-3700 (Worldwide)
    614-447-3751 (Fax)