New Japanese Full-Text Patent Database Now Available on STN®
STN now includes JPFULL, the full-text Japanese database of patent applications and patent specifications. Currently JPFULL covers application years 2006 onwards. Historical data will continue to load (one year per week in reverse chronological order) until all records back to 1964 have been incorporated. Once completed, the database will contain approximately 16 million records.
The Japanese Patent Office (JPO) publishes the highest number of patent applications and utility models of all patent authorities. In recent years, JPO filed about 350,000 applications annually.
JPFULL database records contain bibliographic data including patent applicant, inventor, patent assignee number, patent number, application, priority and related (PCT and JP parent) application data, IPC, EPC and ICO classification codes, abstract, and the full text of descriptions and claims. New records become available about ten days after publication and include the complete content.
Abstracts are either machine translated or taken from equivalent documents (according to INPADOCDB), if available. Human translations from JAPIO will replace machine-translated abstracts and titles for Kind Code A documents about three months later. Descriptions and claims will always be machine translated. Bibliographic fields for Title (/TIJA), Patent Applicant(s) (/PAJA) and Inventor(s) (/INJA) will display in Japanese characters, and will not be searchable. JPO allocates the Patent Assignee Number (/PAN). Words such as the, of, is and which will not be indexed (see HELP STOPWORD for details).
Each database record contains all documents published for one application, displayed in order of appearance. Legal status data, patent and non-patent citations, and family display formats from the INPADOCDB database are available. Online thesauri for the International Patent Classification (/IPC) and European Patent Classification (/EPC and /ICO) are searchable.
Numeric values of over 55 physical and chemical properties (/PHP) in almost 1,800 unit variants are searchable in all full text fields. Simultaneous left and right truncation (SLART) is available in the Basic Index, Title, Abstract and Claims. Automatic current awareness searches (SDIs) may be run weekly (default) or monthly.
For additional information about this new database, refer to the STN Database Summary Sheet or STNGuide.
(=> S JPFULL/DBN).